Novtek Test Systems
Description
pulled from site's meta descriptionManufacturer of automatic test equipment (ATE) for flash memory devices.
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Categories:
- AboutUs AutoGen
- Novtek
- non volatile memory
- NVM
- ATE
- test
- flash
- flash memory
- flash memory test
- test systems
- automatic test equipment
- EPROM
- EEPROM
- PMU
- APG
- wafersort
- wafer sort
- production test
- cycling
- endurance cycling
- redundancy
- burn-in
- HTRB
- JEDEC
- MIL-STD-883D
- TDBI
- dynamic life test
- bit map
- Fowler-Nordheim tunneling
- Mask ROM
- FeRAM
- FRAM
- HAST
- JESD22
- failure mechanism
- redundancy repair
- algorithmic pattern generator
- vector pattern generator
- data log
- wafer map
- JTAG
- DUT
- DIB
- environmental
- automated test equipment
- parallel test systems
- split gate
- floating gate
- tunnel oxide
- accelerated testing
- activation energy
- Barlow's Method
- bath-tub curve
- fimodal
- degradation
- Duane's model
- Eyring Equation
- failure analysis
- infant mortality
- failure mechanisms
- Markov Model
- Markovian burn-in
- reliability
- stress
- MIL-HDBK-217C
- electron mobility
- MIL-STD-38510
- NVSRAM
- stacked gate
- functional test
- AC test
- access time
- E2PROM
- pin driver
- pin electronics