ProbiOn.fr
Title
Welcome to Probion Analysis (Materials analysis ,SIMS analysis ,RBS ,TRPL ,XPS ,Imaging)
Description
Probion uses the most advanced SIMS technology that exists today. Our technical staff has extensive experience in the analysis of surface and thin film composition of silicon based structures as well as compound semiconductors.
Because the composition of your thin films is critical to your competitive edge, Probion warranties to each customer complete security regarding the analysis of your materials. Please feel free to inquire about the details of this unique guarantee.
SIMS allows surface analysis and depth profiling in almost any solid material. Our instruments, 3F and 4F CAMECA, show high sensitivity, extreme dynamic concentration range, together with high depth resolution and ultimate mass separation capability. They are especially useful to measure trace elements undetected by other techniques. This is true for any element, including hydrogen.
Additional Information
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