Aquila-Instruments.com
Title
Thin Film Thickness Measurement equipment for analysis of refractive index, extinction coefficient and Coating Thickness
Description
Excerpted from the website:
- Aquila Instruments Ltd is a Cambridge based manufacturer of precision optical instrumentation, specialising in Spectrophotometry systems for the non-contact measurement of thin film coatings.
- Our core activities are in the fields of ultra-high stability, ultra-high precision optical measurements and the development of advanced numerical techniques for application-specific data analysis. These, together with our specialisation in thin film metrology, are reflected in our range of optical thin film measurement equipment. We are also able to design bespoke solutions for more specialised thin film analysis applications.
Additional Information
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Categories:
- A Silicon
- Cmp
- Cvd
- Ellipsometry
- Equipment
- Extinction Coefficient
- Film
- Film Thickness Measurement
- Films
- Gauge
- Instruments And Supplies
- Integrated Metrology
- Interferometry
- Laboratory Equipment
- Layer Measurement
- Measure
- Measurement
- Metal Film Absorption
- Metal Oxide
- Metal Oxide Thin Film
- Nitride
- Optical Measurement
- Optical Properties
- Optical Thin Film
- Oxide
- Oxynitride
- Pvd
- Photoresist
- Polyimide
- Polymer
- Polysilicon
- Process Control
- Refractive Index
- Science
- Semiconductor
- Si3 N4
- Si Ny
- Si O2
- Silica
- Single Beam Spectrophotometer
- Spectral Reflectance
- Spectrometer
- Spectrophotometer
- Spectroscopic Ellipsometer
- Spectroscopic Ellipsometry
- Spectroscopy
- Ta2 O5
- Thickness Mapping
- Thickness Measurement
- Thin
- Thin Film Analysis
- Thin Film Measurement
- Thin Film Properties
- Thin Film Technology
- Thin Film Thickness Measurement
- Ti O2
- Ti Ox
- Titania
- Transparent Substrates
- A-silicon
- CMP
- CVD
- For
- Instruments and Supplies
- PVD
- Si3N4
- SiNy
- SiO2
- Ta2O5
- TiO2
- TiOx